const searchPopup_search_default = document.getElementById('search-default-content');const searchInput_search_default = document.getElementById('search-default-input'); // 监听实例的弹窗显示状态变化 const observer_search_default = new MutationObserver(() => {// 当弹窗从隐藏变为显示时,执行当前实例的输入框聚焦 if (searchPopup_search_default.style.display !== 'none' && !searchPopup_search_default.hidden) {searchInput_search_default.focus(); // 核心聚焦方法 // 可选:聚焦后选中输入框内内容,方便直接替换(按需开启) // searchInput_.select(); observer_search_default.disconnect(); // 聚焦一次后断开,避免重复触发 }}); // 启动当前实例的监听,仅监听自身弹窗的属性变化,各实例完全独立 observer_search_default.observe(searchPopup_search_default, {attributes: true,attributeFilter: ['style', 'hidden', 'class'] // 仅监听关键属性,性能最优 });

IC EMC Test

This catalog summarizes the instructions prepared by our company on how to test ICs for electromagnetic compatibility EMC. You can learn here the flow of standardized EMC testing of IC chips, including the design of test-adapted PCB boards, how the chip under test works, and other professional knowledge.

The following study materials are currently categorized:

Total number of study materials posted in current category: 9; Total number of materials on current page: 8.

EMC Interference Coupling Methods for Integrated Circuit ICs

EMC Interference Coupling Methods for Integrated Circuit ICs

Integrated circuits (ICs) are often the ultimate source of unintentional electromagnetic radiation from electronic devices and systems. However, ICs are too small to radiate on their own. In order to radiate fields strong enough to cause interference problems, ICs ICs are coupled in a way that EMC interference...

EMC test items and test equipment for IC integrated circuits

EMC test items and test equipment for IC integrated circuits

Users of IC integrated circuits are able to compare various types of ICs based on their EMC parameters. IC developers should have a good understanding of the EMC test programs and test equipment for IC integrated circuits, with the goal of identifying those for which EMC immunity...

EMC Requirements for Integrated Circuit Chips in Automotive Electronics

EMC Requirements for Integrated Circuit Chips in Automotive Electronics

EMC problems during the development of electronic modules for the automotive industry lead to very high development costs and loss of time, so the EMC requirements of automotive electronics for integrated circuit chips on-board chips need to meet certain standard limits. That is why more and more ...

IC Reactions induced by electromagnetic field coupling of integrated circuit chips

IC Reactions induced by electromagnetic field coupling of integrated circuit chips

The impact of EMC on chip functionality can vary widely, from brief tolerable failures (e.g., short time switching of port outputs) to complete IC failures, i.e., permanent loss of functionality. This paper discusses the transmission through IC pins ...

evalsuation of IC integrated circuit chips subjected to ESD static electricity

evalsuation of IC integrated circuit chips subjected to ESD static electricity

This paper presents an evalsuation of the effects of ESD static electricity on IC integrated circuit chips.ICs are often the cause of interference emissions or immunity weaknesses, where it is difficult to control them. Over time, the structure of ICs becomes smaller and smaller...

IC EMC Integrated Circuit Electromagnetic Compatibility Test System

IC EMC Integrated Circuit Electromagnetic Compatibility Test System

This paper describes IC EMC problems stemming from the fact that the sensitivity of ICs to fast pulses increases significantly with their structural dimensions, operating voltages, and fewer operating points, and shows that improving the EMC performance of IC integrated circuits should start with compliance with the IEC standard ...

IC Integrated Circuit EMC DPI Test Methods

IC Integrated Circuit EMC DPI Test Methods

The EMC standard for ICs (IEC 62132) provides three typical measurement methods for such characterization: the DPI (Direct Power Injection) method, the TEM cell (Transverse Electromagnetic Cell) method, and the IC strip line...

EMC test analysis from device to chip

EMC test analysis from device to chip

The analysis of EMC testing from device to chip consists of two parts. The benefit of analyzing immunity at the IC level is that it does not need to take into account the impact of the device design on EMC. This includes, for example, the design of the printed circuit board, the nature of the connectors and the available...

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